0
views
0
recommends
+1 Recommend
0 collections
    0
    shares
      • Record: found
      • Abstract: found
      • Article: found
      Is Open Access

      Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?

      , ,
      Microscopy and Microanalysis
      Cambridge University Press (CUP)

      Read this article at

      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Abstract

          Current progress in programmable electrostatic phase plates raises questions about their usefulness for specific applications. Here, we explore different designs for such phase plates with the specific goal of correcting spherical aberration in the transmission electron microscope (TEM). We numerically investigate whether a phase plate could provide down to 1 Ångström spatial resolution on a conventional uncorrected TEM. Different design aspects (fill factor, pixel pattern, symmetry) were evaluated to understand their effect on the electron probe size and current density. Some proposed designs show a probe size (d50) down to 0.66 Å, proving that it should be possible to correct spherical aberration well past the 1 Å limit using a programmable phase plate consisting of an array of electrostatic phase-shifting elements.

          Related collections

          Most cited references34

          • Record: found
          • Abstract: not found
          • Article: not found

          What spatial light modulators can do for optical microscopy

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Electron microscopy image enhanced

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              �ber einige Fehler von Elektronenlinsen

                Bookmark

                Author and article information

                Contributors
                (View ORCID Profile)
                Journal
                Microscopy and Microanalysis
                Cambridge University Press (CUP)
                1431-9276
                1435-8115
                February 01 2023
                February 01 2023
                January 14 2023
                February 01 2023
                February 01 2023
                January 14 2023
                : 29
                : 1
                : 341-351
                Article
                10.1017/S1431927622012260
                3592fdb2-8de1-45aa-b22d-6f62328523dc
                © 2023

                https://academic.oup.com/pages/standard-publication-reuse-rights

                Free to read

                https://creativecommons.org/licenses/by/4.0/

                History

                Comments

                Comment on this article