Critical dimensions for the formation of interfacial misfit dislocations of In 0.6 Ga 0.4 As islands on GaAs(001)

There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

Related collections

Author and article information

Journal

Title: Thin Solid Films

Abbreviated Title: Thin Solid Films

Publisher: Elsevier BV

ISSN (Print): 00406090

Publication date Created: June 2000

Publication date (Print): June 2000

Volume: 368

Issue: 1

Pages: 93-104

Article

DOI: 10.1016/S0040-6090(00)00858-0

SO-VID: 3fba2dfa-416e-49ea-a1cf-0ead71b843ba

License:

http://www.elsevier.com/tdm/userlicense/1.0/

History

Data availability:

Comments

Comment on this article

scite_

Cited by 6

See all cited by