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      A distance measure between attributed relational graphs for pattern recognition

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          Journal
          Title: IEEE Transactions on Systems, Man, and Cybernetics
          Abbreviated Title: IEEE Trans. Syst., Man, Cybern.
          Publisher: Institute of Electrical and Electronics Engineers (IEEE)
          ISSN (Print): 0018-9472
          ISSN (Electronic): 2168-2909
          Publication date Created: May 1983
          Publication date (Print): May 1983
          Volume: SMC-13
          Issue: 3
          Pages: 353-362
          Article
          DOI: 10.1109/TSMC.1983.6313167
          SO-VID: 403abb5e-e8b6-4a66-8b4e-70349071a36f
          Copyright © © 1983
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