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Study of the Wet Re-Oxidation Annealing of SiO
2
/4H-SiC (0001) Interface Properties by AR-XPS Measurements
Author(s):
A. Ekoué
,
O RENAULT
,
Thierry Billon
,
Lea Di Cioccio
,
Gérard Guillot
,
O. Renault
Publication date:
2003
Journal:
MSF
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NTT Journal for Theology and the Study of Religion
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Journal
DOI::
10.4028/www.scientific.net/MSF.433-436.555
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