Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate

Lennard, W. N.; Tougaard, S; McIntyre, N. S.; Kobe, B. A.; Grosvenor, A. P.

doi:10.1002/sia.1842

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Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate

Author(s): A. P. Grosvenor , B. A. Kobe , N. S. McIntyre , S. Tougaard , W. N. Lennard

Publication date Created: July 2004

Publication date (Print): July 27 2004

Journal: Surface and Interface Analysis

Publisher: Wiley-Blackwell

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Title: Surface and Interface Analysis

Abbreviated Title: Surf. Interface Anal.

Publisher: Wiley-Blackwell

ISSN (Print): 0142-2421

ISSN (Electronic): 1096-9918

Publication date Created: July 2004

Publication date (Print): July 27 2004

Volume: 36

Issue: 7

Pages: 632-639

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DOI: 10.1002/sia.1842

SO-VID: 42b602a4-8d6a-4923-a1b3-9b7f631f7b97

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http://doi.wiley.com/10.1002/tdm_license_1.1

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Use of QUASES™/XPS measurements to determine the oxide composition and thickness on an iron substrate

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