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      Antenna Phase Center Calibration for Array InSAR System Based on Orthogonal Subspace

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          Abstract

          The array InSAR system obtains a three-dimensional image of an observed scene using a combination of pulse compression and synthetic and real aperture techniques. However, Antenna Phase Center (APC) errors can occur within a practical array InSAR system, which thus degrades the imaging quality in a height direction. The aim of this paper is to improve calibration problems occurring with APC errors. The effect of APC errors is analyzed, and a calibration method based on the orthogonal subspace principle is proposed that utilizes SAR Single Look Complex (SLC) to obtain the noise subspace through eigenvalue decomposition. The subspace orthogonal principle is then used to solve the APC positions of multiple channels simultaneously. In addition, a calibration scheme for the APC position is presented for application with an array InSAR system. The effectiveness of the proposed calibration method is verified using simulations and experimental results.

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          Author and article information

          Journal
          Journal of Radars
          Chinese Academy of Sciences
          01 June 2018
          : 7
          : 3
          : 335-345
          Affiliations
          [1 ] ①(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China) ②(National Key Laboratory of Science and Technology on Microwave Imaging, Beijing 100190, China) ③(University of Chinese Academy of Sciences, Beijing 100049, China)
          [2 ] ①(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China) ②(National Key Laboratory of Science and Technology on Microwave Imaging, Beijing 100190, China)
          Article
          1f4aeea8130c45bbbe38d24745050a42
          10.12000/JR18007

          This work is licensed under a Creative Commons Attribution 4.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

          Categories
          Technology (General)
          T1-995

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