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On the universality of inversion layer mobility in Si MOSFET's: Part I-effects of substrate impurity concentration
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Most cited references15
- Record: found
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Electronic properties of two-dimensional systems
Tsuneya Ando, Alan Fowler, Frank Stern (1982)
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Properties of Semiconductor Surface Inversion Layers in the Electric Quantum Limit
Frank Stern, W. E. Howard (1967)
- Record: found
- Abstract: not found
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Electron mobility in inversion and accumulation layers on thermally oxidized silicon surfaces
J.D. Plummer, S.C. Sun (1980)