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Lattice strain induced phase selection and epitaxial relaxation in crystalline GeTe thin film
Author(s):
F. Tong
,
J.D. Liu
,
X.M. Cheng
,
J.H. Hao
,
G.Y. Gao
,
H. Tong
,
X.S. Miao
Publication date
Created:
October 2014
Publication date
(Print):
October 2014
Journal:
Thin Solid Films
Publisher:
Elsevier BV
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HR-EBSD (High Resolution - Electron Back Scatter Diffraction)
Author and article information
Journal
Title:
Thin Solid Films
Abbreviated Title:
Thin Solid Films
Publisher:
Elsevier BV
ISSN (Print):
00406090
Publication date Created:
October 2014
Publication date (Print):
October 2014
Volume
: 568
Pages
: 70-73
Article
DOI:
10.1016/j.tsf.2014.08.006
SO-VID:
49c530e4-f2ed-4002-9bc9-8354f5b838e0
Copyright ©
© 2014
License:
https://www.elsevier.com/tdm/userlicense/1.0/
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