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      Deep transfer metric learning

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      Author(s): , ,
      Publication date (Print):
      Conference name: 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
      Conference date: July 7, 2015 - July 12, 2015

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          Conference
          Publication date (Print): June 2015
          Pages: 325-333
          Article
          DOI: 10.1109/CVPR.2015.7298629
          SO-VID: 4af722b9-2de2-4251-93d1-ffa1c9c0a6a8
          Copyright © © 2015
          Conference name: 2015 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
          Conference location: Boston, MA, USA
          Conference date: July 7, 2015 - July 12, 2015
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