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      Electromigration in thin-film interconnection lines: models, methods and results

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      Materials Science Reports
      Elsevier BV

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          Low-frequency fluctuations in solids:1fnoise

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            Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

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              Electromigration in thin aluminum films on titanium nitride

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                Author and article information

                Journal
                Materials Science Reports
                Materials Science Reports
                Elsevier BV
                09202307
                December 1991
                December 1991
                : 7
                : 4-5
                : 143-220
                Article
                10.1016/0920-2307(91)90005-8
                4b2caffa-cd27-4c4f-89c0-7e2b2d0c5dd0
                © 1991

                http://www.elsevier.com/tdm/userlicense/1.0/

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