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      Analysis of traction-free assumption in high-resolution EBSD measurements.

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          Abstract

          The effects of using a traction-free (plane-stress) assumption to obtain the full distortion tensor from high-resolution EBSD measurements are analyzed. Equations are derived which bound the traction-free error arising from angular misorientation of the sample surface; the error in recovered distortion is shown to be quadratic with respect to that misorientation, and the maximum 'safe' angular misorientation is shown to be 2.7 degrees. The effects of localized stress fields on the traction-free assumption are then examined by a numerical case study, which uses the Boussinesq formalism to model stress fields near a free surface. Except in cases where localized stress field sources occur very close to sample points, the traction-free assumption appears to be admirably robust.

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          Author and article information

          Journal
          J Microsc
          Journal of microscopy
          Wiley
          1365-2818
          0022-2720
          Oct 2015
          : 260
          : 1
          Affiliations
          [1 ] Department of Mechanical Engineering, Brigham Young University, Provo, Utah, U.S.A.
          [2 ] Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts, U.S.A.
          [3 ] Department of Materials Science & Engineering, Department of Mechanical & Aerospace Engineering, Ohio State University, Columbus, Ohio, U.S.A.
          Article
          10.1111/jmi.12268
          26138919
          4bae9cb8-cbde-472a-8f7e-911083ac6228
          History

          HR-EBSD,lattice distortion,traction-free
          HR-EBSD, lattice distortion, traction-free

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