- Record: found
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Imaging and counting threading dislocations in c-oriented epitaxial GaN layers
M Khoury ,
A Courville ,
B Poulet ,
M Teisseire ,
E Beraudo ,
M J Rashid ,
E Frayssinet ,
B Damilano ,
F Semond ,
O Tottereau ,
P Vennéguès
February 04 2013
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X-ray diffraction of III-nitrides
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