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      FAULTS: a program for refinement of structures with extended defects

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      Journal of Applied Crystallography
      International Union of Crystallography (IUCr)

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          Abstract

          The FAULTSprogram is a powerful tool for the refinement of diffraction patterns of materials with planar defects. A new release of the FAULTSprogram is herein presented, together with a number of new capabilities, aimed at improving the refinement process and evolving towards a more user-friendly approach. These include the possibility to refine multiple sets of single-crystal profiles of diffuse streaks, the visualization of the model structures, the possibility to add the diffracted intensities from secondary phases as background and the new DIFFaX2FAULTSconverter, among others. Three examples related to battery materials are shown to illustrate the capabilities of the program.

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          Recent advances in magnetic structure determination by neutron powder diffraction

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            Structural classification and properties of the layered oxides

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              Rietveld refinement of Debye–Scherrer synchrotron X-ray data from Al2O3

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                Author and article information

                Journal
                JACGAR
                Journal of Applied Crystallography
                J Appl Crystallogr
                J Appl Cryst
                International Union of Crystallography (IUCr)
                1600-5767
                December 2016
                November 02 2016
                December 01 2016
                : 49
                : 6
                : 2259-2269
                Article
                10.1107/S1600576716014473
                4dadc2b0-a631-469a-9110-3819af757c05
                © 2016

                http://journals.iucr.org/services/copyrightpolicy.html

                http://journals.iucr.org/services/copyrightpolicy.html#TDM

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