Inducing features of random fields

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Journal

Title: IEEE Transactions on Pattern Analysis and Machine Intelligence

Abbreviated Title: IEEE Trans. Pattern Anal. Machine Intell.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 01628828

Publication date (Print): April 1997

Volume: 19

Issue: 4

Pages: 380-393

Article

DOI: 10.1109/34.588021

SO-VID: 4f925cf1-d483-4c06-925e-a36d4274b7af

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