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Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

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      Journal
      Acta Materialia
      Acta Materialia
      Elsevier BV
      13596454
      February 2017
      February 2017
      : 125
      :
      : 125-135
      10.1016/j.actamat.2016.11.039
      © 2017

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