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      Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN thin films

      , , , , , ,

      Acta Materialia

      Elsevier BV

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          Journal
          Acta Materialia
          Acta Materialia
          Elsevier BV
          13596454
          February 2017
          February 2017
          : 125
          :
          : 125-135
          10.1016/j.actamat.2016.11.039
          © 2017

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