Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation.

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Abstract

Ventricular arrhythmias (VA) after left ventricular assist device (LVAD) placement are associated with increased morbidity and mortality. We sought to assess epicardial voltage characteristics at the time of LVAD implantation and investigate relationships between scar burden and postimplant VA.

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Journal

Journal ID (iso-abbrev): J. Cardiovasc. Electrophysiol.

Title: Journal of cardiovascular electrophysiology

Publisher: Wiley

ISSN (Electronic): 1540-8167

ISSN (Print): 1045-3873

Publication date (Electronic): February 2019

Volume: 30

Issue: 2

Affiliations

[1 ] Department of Medicine, Division of Cardiology, Section of Cardiac Electrophysiology, University of California San Francisco, San Francisco, California.

[2 ] Abbott, Cardiac Arrhythmias, Chicago, Illinois.

[3 ] Department of Medicine, Section of Cardiology, Center for Arrhythmia Care, University of Chicago Medicine, Chicago, Illinois.

[4 ] Department of Surgery, Section of Cardiac and Thoracic Surgery, University of Chicago Medicine, Chicago, Illinois.

[5 ] Department of Medicine, Division of Cardiology, Section of Heart Failure, University of California San Francisco, San Francisco, California.

[6 ] Department of Surgery, Division of Adult Cardiothoracic Surgery, University of California San Francisco, San Francisco, California.

[7 ] Department of Medicine, Section of Cardiology, University of Chicago Medicine, Chicago, IL.

Article

DOI: 10.1111/jce.13803

PubMed ID: 30516301

SO-VID: 50dea0a0-2df5-49f1-8826-00da5346f49b

History

Keywords: left ventricular assist device,ventricular arrhythmia,mapping,epicardial,mechanical circulatory support

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Keywords: left ventricular assist device, ventricular arrhythmia, mapping, epicardial, mechanical circulatory support

Feasibility and utility of intraoperative epicardial scar characterization during left ventricular assist device implantation.

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