Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC

Picard, Y. N.; Powell, J A; Twigg, M. E.; Caldwell, J D; Neudeck, P. G.; Trunek, A. J.; Eddy, C R

doi:10.1063/1.2746075

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Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC

Author(s): Y. N. Picard , M. E. Twigg , J. D. Caldwell , C. R. Eddy , P. G. Neudeck , A. J. Trunek , J. A. Powell

Publication date Created: June 04 2007

Publication date (Print): June 04 2007

Journal: Applied Physics Letters

Publisher: AIP Publishing

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WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

I Horcas, R FERNÁNDEZ, J. M. Gómez-Rodríguez … (2007)

In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.