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Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC

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      Most cited references 17

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      WSXM: a software for scanning probe microscopy and a tool for nanotechnology.

      In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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        Large-band-gap SiC, III-V nitride, and II-VI ZnSe-based semiconductor device technologies

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          Substrates for gallium nitride epitaxy

           L. Liu,  J.H. Edgar (2002)
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            Author and article information

            Journal
            Applied Physics Letters
            Appl. Phys. Lett.
            AIP Publishing
            0003-6951
            1077-3118
            June 04 2007
            June 04 2007
            : 90
            : 23
            : 234101
            10.1063/1.2746075
            © 2007
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