99
views
0
recommends
+1 Recommend
1 collections
    4
    shares
      • Record: found
      • Abstract: not found
      • Article: not found

      Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

      , , ,
      Journal of Applied Physics
      AIP Publishing

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references11

          • Record: found
          • Abstract: not found
          • Article: not found

          Atomic Force Microscope

            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

                Bookmark

                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                January 15 1991
                January 15 1991
                : 69
                : 2
                : 668-673
                Article
                10.1063/1.347347
                514a0e2d-6cd1-4285-8a74-2343d809c5df
                © 1991
                History

                Comments

                Comment on this article