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      Electromigration and crevice formation in thin metallic films

      Thin Solid Films
      Elsevier BV

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          Journal
          Thin Solid Films
          Thin Solid Films
          Elsevier BV
          00406090
          November 1972
          November 1972
          : 13
          : 1
          : 117-129
          Article
          10.1016/0040-6090(72)90164-2
          516747c9-ad78-482b-9380-dfd5c5a6cac7
          © 1972

          http://www.elsevier.com/tdm/userlicense/1.0/

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