For Publishers
DiscoveryMetadataPeer reviewHostingPublishing
For Researchers
JoinPublishReviewCollect
Register
Blog
About
Search
Advanced search
My ScienceOpen
Search
For Publishers
For Researchers
Blog
About
5
views
19
references
 Top references
cited by
1
    
0 reviews
 Review
0
comments
 Comment
0
recommends
+1 Recommend
0 collections
    0
    shares
      3,667
      similar
       All similar
      • Record: found
      • Abstract: not found
      • Article: not found

      Dynamic SEU Sensitivity of Designs on Two 28-nm SRAM-Based FPGA Architectures

      Read this article at

      ScienceOpenPublisher
      Bookmark
          There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.

          Related collections

          Most cited references19

          • Record: found
          • Abstract: not found
          • Article: not found

          The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs

          A. Lesea, S. Drimer, J.J. Fabula … (2005)
          Article 0 comments Cited 17 times – based on 0 reviews     Review now
            Bookmark
            • Record: found
            • Abstract: not found
            • Article: not found

            Soft errors in advanced semiconductor devices-part I: the three radiation sources

            R.C. Baumann (2001)
            Article 0 comments Cited 17 times – based on 0 reviews     Review now
              Bookmark
              • Record: found
              • Abstract: not found
              • Article: not found

              RT-level ITC'99 benchmarks and first ATPG results

              F. Corno, M.S. Reorda, G. Squillero … (2000)
              Article 0 comments Cited 16 times – based on 0 reviews     Review now
                Bookmark
                All references

                Author and article information

                Journal
                Title: IEEE Transactions on Nuclear Science
                Abbreviated Title: IEEE Trans. Nucl. Sci.
                Publisher: Institute of Electrical and Electronics Engineers (IEEE)
                ISSN (Print): 0018-9499
                ISSN (Electronic): 1558-1578
                Publication date Created: January 2018
                Publication date (Print): January 2018
                Volume: 65
                Issue: 1
                Pages: 280-287
                Article
                DOI: 10.1109/TNS.2017.2772288
                SO-VID: 57366deb-b61a-4ba1-893a-264cf10757b5
                Copyright © © 2018
                License:

                History

                Data availability:

                Comments

                Comment on this article