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Dislocation nucleation near the critical thickness in GeSi/Si strained layers

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      Most cited references 17

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      Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures

       J. C. Bean,  R. People (1985)
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        GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy

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          Physics and applications of Ge<inf>x</inf>Si<inf>1-x</inf>/Si strained-layer heterostructures

           R. People (1986)
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            Author and article information

            Journal
            Philosophical Magazine A
            Philosophical Magazine A
            Informa UK Limited
            0141-8610
            1460-6992
            August 20 2006
            August 20 2006
            : 59
            : 5
            : 1059-1073
            10.1080/01418618908209837
            © 2006

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