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      A Novel Cluster-Analysis Algorithm Based on MAP Framework for Multi-baseline InSAR Height Reconstruction

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          Abstract

          The multi-baseline InSAR can effectively reduce the adverse effect caused by the abrupt change of the target and the large noise disturbance and can obtain the Digital Elevation Model (DEM) that is more accurate than the single baseline InSAR. Traditional multi-baseline height reconstruction algorithm based on Maximum Likelihood (ML) estimation is poorly reconstructed in the case of fewer channels, and the height reconstruction algorithm based on Maximum A Posteriori estimation (MAP) has a long runtime defect; to solve this problem, this study proposes the cluster analysis based on maximum a posteriori algorithm. This algorithm uses the ML estimation to obtain a rough DEM. Based on this result, the noise pixels in the neighborhood in each iteration process are determined by cluster analysis. Finally, through the calculation of posterior probability to complete the reconstruction, an optimized method is adopted to improve the accuracy. Experiments reveal that the algorithm retains the speed of the ML method as well as the high precision of the MAP estimation, thus maintaining accuracy and high operating efficiency.

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          Author and article information

          Journal
          Journal of Radars
          Chinese Academy of Sciences
          01 December 2017
          : 6
          : 6
          : 640-652
          Affiliations
          [1 ] ①(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China) ②(University of Chinese Academy of Sciences, Beijing 100039, China)
          [2 ] ①(Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China)
          Article
          461bbe09d5d84dbfb54a9e7fec463552
          10.12000/JR17043

          This work is licensed under a Creative Commons Attribution 4.0 Unported License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

          Categories
          Technology (General)
          T1-995

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