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Coexistence of volatile and non-volatile resistive switching in 2D h-BN based electronic synapses
proceedings-article
Author(s):
Y. Shi
,
C. Pan
,
V. Chen
,
N. Raghavan
,
K. L. Pey
,
F. M. Puglisi
,
E. Pop
,
H.-S. P. Wong
,
M. Lanza
Publication date
(Print):
December 2017
Conference name:
2017 IEEE International Electron Devices Meeting (IEDM)
Conference date:
2, 2017 - 6, 2017
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Conference
Publication date:
December 2017
Publication date (Print):
December 2017
Pages
: 5.4.1-5.4.4
Article
DOI:
10.1109/IEDM.2017.8268333
SO-VID:
5c458d7a-1918-46e6-abdb-97017efd329a
Copyright ©
© 2017
Conference name:
2017 IEEE International Electron Devices Meeting (IEDM)
Conference location:
San Francisco, CA, USA
Conference date:
2, 2017 - 6, 2017
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