Survey on recent counterfeit IC detection techniques and future research directions

Oriero, Enahoro; Hasan, Syed Rafay

doi:10.1016/j.vlsi.2019.02.006

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Survey on recent counterfeit IC detection techniques and future research directions

Author(s): Enahoro Oriero , Syed Rafay Hasan

Publication date Created: March 2019

Publication date (Print): March 2019

Journal: Integration

Publisher: Elsevier BV

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Title: Integration

Abbreviated Title: Integration

Publisher: Elsevier BV

ISSN (Print): 01679260

Publication date Created: March 2019

Publication date (Print): March 2019

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DOI: 10.1016/j.vlsi.2019.02.006

SO-VID: 5e6e0e6d-5313-41a9-8716-d79b44bf53ab

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https://www.elsevier.com/tdm/userlicense/1.0/

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Survey on recent counterfeit IC detection techniques and future research directions

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