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      Metrological analysis of the LIDFT method

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          Journal
          IEEE Transactions on Instrumentation and Measurement
          IEEE Trans. Instrum. Meas.
          Institute of Electrical and Electronics Engineers (IEEE)
          00189456
          Feb. 2002
          : 51
          : 1
          : 67-71
          Article
          10.1109/19.989903
          5f72bf47-da59-4d67-816e-f90ec0f08de7
          © 2002
          History

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