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      The tomographic atom probe: A quantitative three‐dimensional nanoanalytical instrument on an atomic scale

      Author(s): , , , , ,
      Publication date Created:
      Publication date (Print):
      Journal: Review of Scientific Instruments
      Publisher: AIP Publishing

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          Microchannel plate detectors

          Joseph Ladislas Wiza (1979)
          Article 0 comments Cited 206 times – based on 0 reviews     Review now
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            The Atom‐Probe Field Ion Microscope

            Erwin W. Müller, S. McLane, John Panitz (1968)
            Article 0 comments Cited 116 times – based on 0 reviews     Review now
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              Pulsed‐laser atom‐probe field‐ion microscopy

              T T Tsong, G. L. Kellogg (1980)
              Article 0 comments Cited 87 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Review of Scientific Instruments
                Abbreviated Title: Review of Scientific Instruments
                Publisher: AIP Publishing
                ISSN (Print): 0034-6748
                ISSN (Electronic): 1089-7623
                Publication date Created: October 1993
                Publication date (Print): October 1993
                Volume: 64
                Issue: 10
                Pages: 2911-2919
                Article
                DOI: 10.1063/1.1144382
                SO-VID: 61fc836d-976f-4a49-8957-7926c3cda1d2
                Copyright © © 1993
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