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      Investigation of thermally oxidised silicon surfaces using metal-oxide-semiconductor structures

      , , ,
      Solid-State Electronics
      Elsevier BV

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          An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodes

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            Work Function, Photoelectric Threshold, and Surface States of Atomically Clean Silicon

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              Physical Theory of Semiconductor Surfaces

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                Author and article information

                Journal
                Solid-State Electronics
                Solid-State Electronics
                Elsevier BV
                00381101
                February 1965
                February 1965
                : 8
                : 2
                : 145-163
                Article
                10.1016/0038-1101(65)90046-8
                6288c331-a85b-49bc-ac86-26af6017d973
                © 1965

                http://www.elsevier.com/tdm/userlicense/1.0/

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