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      X-ray scattering studies of thin films and surfaces: thermal oxides on silicon

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      Journal of Physics D: Applied Physics

      IOP Publishing

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          Most cited references 9

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          Surface Studies of Solids by Total Reflection of X-Rays

           L. G. Parratt (1954)
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            Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates

             P Croce,  L. Névot (1980)
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              Crystal truncation rods and surface roughness

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                Author and article information

                Journal
                Journal of Physics D: Applied Physics
                J. Phys. D: Appl. Phys.
                IOP Publishing
                0022-3727
                1361-6463
                January 14 1987
                January 14 1987
                : 20
                : 1
                : 61-68
                Article
                10.1088/0022-3727/20/1/010
                © 1987

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