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      X-ray scattering studies of thin films and surfaces: thermal oxides on silicon

      Author(s): ,
      Publication date Created:
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      Journal: Journal of Physics D: Applied Physics
      Publisher: IOP Publishing

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          Surface Studies of Solids by Total Reflection of X-Rays

          L. G. Parratt (1954)
          Article 0 comments Cited 714 times – based on 0 reviews     Review now
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            Caractérisation des surfaces par réflexion rasante de rayons X. Application à l'étude du polissage de quelques verres silicates

            P Croce, L. Névot (1980)
            Article 0 comments Cited 213 times – based on 0 reviews     Review now
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              Crystal truncation rods and surface roughness

              I. K. Robinson (1986)
              Article 0 comments Cited 172 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Physics D: Applied Physics
                Abbreviated Title: J. Phys. D: Appl. Phys.
                Publisher: IOP Publishing
                ISSN (Print): 0022-3727
                ISSN (Electronic): 1361-6463
                Publication date Created: January 14 1987
                Publication date (Print): January 14 1987
                Volume: 20
                Issue: 1
                Pages: 61-68
                Article
                DOI: 10.1088/0022-3727/20/1/010
                SO-VID: 63caa98a-7914-4205-b744-522ce06c29aa
                Copyright © © 1987
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