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      Specimen-thickness effects on transmission Kikuchi patterns in the scanning electron microscope : SPECIMEN-THICKNESS EFFECTS ON TRANSMISSION KIKUCHI PATTERNS IN SEM

      Author(s): 1 , 1 , 2
      Publication date (Electronic):
      Journal: Journal of Microscopy
      Publisher: Wiley

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          The application of electron backscatter diffraction and orientation contrast imaging in the SEM to textural problems in rocks

          Steve Reddy, Richard Spiess, Nick Timms … (1999)
          Article 0 comments Cited 90 times – based on 0 reviews     Review now
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            An empirical stopping power relationship for low-energy electrons

            D. Joy, S. Luo (1989)
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              Transmission EBSD from 10 nm domains in a scanning electron microscope

              R.R. KELLER, R.H. GEISS (2012)
              Article 0 comments Cited 53 times – based on 0 reviews     Review now
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                Author and article information

                Journal
                Title: Journal of Microscopy
                Abbreviated Title: Journal of Microscopy
                Publisher: Wiley
                ISSN: 00222720
                Publication date Created: June 2014
                Publication date (Print): June 2014
                Publication date (Electronic): March 24 2014
                Volume: 254
                Issue: 3
                Pages: 129-136
                Affiliations
                [1 ]Applied Chemicals and Materials Division; National Institute of Standards and Technology; Boulder Colorado U.S.A.
                [2 ]Department of Chemical and Biological Engineering; University of Colorado; Boulder Colorado U.S.A.
                Article
                DOI: 10.1111/jmi.12124
                SO-VID: 64dde101-27ce-451c-9491-d5ebcfe80ee1
                Copyright © © 2014
                License:

                http://doi.wiley.com/10.1002/tdm_license_1.1

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