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      Demonstration of Y1Ba2Cu3O7−δand complementary metal‐oxide‐semiconductor device fabrication on the same sapphire substrate

      , , , , , ,
      Applied Physics Letters
      AIP Publishing

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          High critical currents in strained epitaxial YBa2Cu3O7−δon Si

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            Bi‐epitaxial grain boundary junctions in YBa2Cu3O7

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              Selective electroless copper for VLSI interconnection

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                August 30 1993
                August 30 1993
                : 63
                : 9
                : 1282-1284
                Article
                10.1063/1.109758
                6eade962-f029-44a0-b77d-aa58433a0865
                © 1993
                History

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