Mapping strains at the nanoscale using electron back scatter diffraction

Wilkinson, Angus J; Meaden, Graham; Dingley, David J

doi:10.1016/j.spmi.2008.10.046

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Mapping strains at the nanoscale using electron back scatter diffraction

Author(s): Angus J. Wilkinson , Graham Meaden , David J. Dingley

Publication date Created: April 2009

Publication date (Print): April 2009

Journal: Superlattices and Microstructures

Publisher: Elsevier BV

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Title: Superlattices and Microstructures

Abbreviated Title: Superlattices and Microstructures

Publisher: Elsevier BV

ISSN (Print): 07496036

Publication date Created: April 2009

Publication date (Print): April 2009

Volume: 45

Issue: 4-5

Pages: 285-294

Article

DOI: 10.1016/j.spmi.2008.10.046

SO-VID: 7003313c-4d88-4124-a24e-ce30db338cf2

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https://www.elsevier.com/tdm/userlicense/1.0/

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Mapping strains at the nanoscale using electron back scatter diffraction

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HR-EBSD (High Resolution - Electron Back Scatter Diffraction)

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