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      Mapping strains at the nanoscale using electron back scatter diffraction

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      Superlattices and Microstructures

      Elsevier BV

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          Journal
          Superlattices and Microstructures
          Superlattices and Microstructures
          Elsevier BV
          07496036
          April 2009
          April 2009
          : 45
          : 4-5
          : 285-294
          10.1016/j.spmi.2008.10.046
          © 2009

          https://www.elsevier.com/tdm/userlicense/1.0/

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