Quantitative Analysis of Current–Voltage Characteristics of Semiconducting Nanowires: Decoupling of Contact Effects

Yao, K.; Peng, L.-M.; Chen, Q.; Liang, X; Jin, C.; Liu, Y.; Zhang, Z.

doi:10.1002/adfm.200600475

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Quantitative Analysis of Current–Voltage Characteristics of Semiconducting Nanowires: Decoupling of Contact Effects

Author(s): Z. Zhang , K. Yao , Y. Liu , C. Jin , X. Liang , Q. Chen , L.-M. Peng

Publication date Created: September 24 2007

Publication date (Print): September 24 2007

Journal: Advanced Functional Materials

Publisher: Wiley-Blackwell

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Title: Advanced Functional Materials

Abbreviated Title: Adv. Funct. Mater.

Publisher: Wiley-Blackwell

ISSN (Print): 1616301X

ISSN (Electronic): 16163028

Publication date Created: September 24 2007

Publication date (Print): September 24 2007

Volume: 17

Issue: 14

Pages: 2478-2489

Article

DOI: 10.1002/adfm.200600475

SO-VID: 71f07b16-5025-4dfe-9526-26dc2999d811

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http://doi.wiley.com/10.1002/tdm_license_1.1

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