Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices

Lux-Steiner, M.Ch; Sadewasser, S; Glatzel, Th; Schuler, S.; Nishiwaki, S; Kaigawa, R.

doi:10.1016/S0040-6090(03)00267-0

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Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices

Author(s): S. Sadewasser , Th. Glatzel , S. Schuler , S. Nishiwaki , R. Kaigawa , M.Ch. Lux-Steiner

Publication date Created: May 2003

Publication date (Print): May 2003

Journal: Thin Solid Films

Publisher: Elsevier BV

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Title: Thin Solid Films

Abbreviated Title: Thin Solid Films

Publisher: Elsevier BV

ISSN (Print): 00406090

Publication date Created: May 2003

Publication date (Print): May 2003

Volume: 431-432

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Pages: 257-261

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DOI: 10.1016/S0040-6090(03)00267-0

SO-VID: 7204532b-9df2-435c-8a98-63f83f4f73a3

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http://www.elsevier.com/tdm/userlicense/1.0/

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Self URI (article page): http://linkinghub.elsevier.com/retrieve/pii/S0040609003002670

Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices

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