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A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry Its Development and Secondary Ion Yield Characteristics
Author(s):
D. Weibel
,
S Wong
,
N. Lockyer
,
P Blenkinsopp
,
R Hill
,
J. C. Vickerman
Publication date:
2003
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AIP Publishing: Coronavirus
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DOI::
10.1021/ac026338o
ScienceOpen disciplines:
Technical & Applied physics
,
Physics
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ScienceOpen disciplines:
Technical & Applied physics
,
Physics
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