Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

Martin, Y; Williams, C C; Wickramasinghe, H. K.

doi:10.1063/1.338807

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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

Author(s): Y. Martin , C. C. Williams , H. K. Wickramasinghe

Publication date Created: May 15 1987

Publication date (Print): May 15 1987

Journal: Journal of Applied Physics

Publisher: AIP Publishing

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Title: Journal of Applied Physics

Abbreviated Title: Journal of Applied Physics

Publisher: AIP Publishing

ISSN (Print): 0021-8979

ISSN (Electronic): 1089-7550

Publication date Created: May 15 1987

Publication date (Print): May 15 1987

Volume: 61

Issue: 10

Pages: 4723-4729

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DOI: 10.1063/1.338807

SO-VID: 7ac94cc6-8eee-41f6-8399-9bd984c9d562

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Self URI (article page): http://aip.scitation.org/doi/10.1063/1.338807

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Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

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Atomic Force Microscopy

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