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      Atomic force microscope–force mapping and profiling on a sub 100‐Å scale

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      Journal of Applied Physics
      AIP Publishing

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          Author and article information

          Journal
          Journal of Applied Physics
          Journal of Applied Physics
          AIP Publishing
          0021-8979
          1089-7550
          May 15 1987
          May 15 1987
          : 61
          : 10
          : 4723-4729
          Article
          10.1063/1.338807
          7ac94cc6-8eee-41f6-8399-9bd984c9d562
          © 1987
          Product
          Self URI (article page): http://aip.scitation.org/doi/10.1063/1.338807

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