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      Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy. SHORT COMMUNICATION

      Journal of Microscopy

      Wiley-Blackwell

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          Author and article information

          Journal
          Journal of Microscopy
          J Microsc
          Wiley-Blackwell
          0022-2720
          1365-2818
          May 2000
          May 2000
          : 198
          : 2
          : 82-87
          Article
          10.1046/j.1365-2818.2000.00710.x
          © 2000

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