Optical constants from the far infrared to the x-ray region: Mg, Al, Cu, Ag, Au, Bi, C, and Al_2O_3

Hagemann, H.-J.; Gudat, W.; Kunz, C.

doi:10.1364/JOSA.65.000742

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Optical constants from the far infrared to the x-ray region: Mg, Al, Cu, Ag, Au, Bi, C, and Al_2O_3

Author(s): H.-J. Hagemann , W. Gudat , C. Kunz

Publication date Created: 1975

Publication date (Print): June 1975

Journal: Journal of the Optical Society of America

Publisher: The Optical Society

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Photoabsorption near the\({L}_{\mathrm{I}\mathrm{I},\mathrm{I}\mathrm{I}\mathrm{I}}\)Edge of Silicon and Aluminum

Frederick Brown, Christian Gähwiller (1970)

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Absorption Measurements of Copper, Silver, Tin, Gold, and Bismuth in the Far Ultraviolet

B Sonntag, T. Sasaki, C. Kunz … (1968)

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Determination of Optical Constants from Intensity Measurements at Normal Incidence

P.-O. Nilsson (1968)

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Title: Journal of the Optical Society of America

Abbreviated Title: J. Opt. Soc. Am.

Publisher: The Optical Society

ISSN (Print): 0030-3941

Publication date Created: 1975

Publication date (Print): June 1975

Volume: 65

Issue: 6

Page: 742

Article

DOI: 10.1364/JOSA.65.000742

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Self URI (article page): https://www.osapublishing.org/abstract.cfm?URI=josa-65-6-742

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Optical constants from the far infrared to the x-ray region: Mg, Al, Cu, Ag, Au, Bi, C, and Al_2O_3

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Most cited references 14

Photoabsorption near the\({L}_{\mathrm{I}\mathrm{I},\mathrm{I}\mathrm{I}\mathrm{I}}\)Edge of Silicon and Aluminum

Absorption Measurements of Copper, Silver, Tin, Gold, and Bismuth in the Far Ultraviolet

Determination of Optical Constants from Intensity Measurements at Normal Incidence

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