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      Random errors in MOS capacitors

      Author(s): , ,
      Publication date Created:
      Publication date (Print):
      Journal: IEEE Journal of Solid-State Circuits
      Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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          Matching properties, and voltage and temperature dependence of MOS capacitors

          J.L. McCreary (1981)
          Article 0 comments Cited 53 times – based on 0 reviews     Review now
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            A two-stage weighted capacitor network for D/A-A/D conversion

            L.M. Terman, Y.S. Yee, L.G. Heller (1979)
            Article 0 comments Cited 10 times – based on 0 reviews     Review now
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              Author and article information

              Journal
              Title: IEEE Journal of Solid-State Circuits
              Abbreviated Title: IEEE J. Solid-State Circuits
              Publisher: Institute of Electrical and Electronics Engineers (IEEE)
              ISSN (Print): 0018-9200
              Publication date Created: December 1982
              Publication date (Print): December 1982
              Volume: 17
              Issue: 6
              Pages: 1070-1076
              Article
              DOI: 10.1109/JSSC.1982.1051862
              SO-VID: 80a5dee2-306e-4c57-8657-06470959218a
              Copyright © © 1982
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