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      Minority carrier diffusion length for electrons in an extended SWIR InAs/AlSb type-II superlattice photodiode

      1 , 2 , 2 , 2 , 1 , 1 , 1
      Applied Physics Letters
      AIP Publishing

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          Depletion-Layer Photoeffects in Semiconductors

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            Variation of minority‐carrier diffusion length with carrier concentration in GaAs liquid‐phase epitaxial layers

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              nBn detector, an infrared detector with reduced dark current and higher operating temperature

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                November 13 2017
                November 13 2017
                : 111
                : 20
                : 201106
                Affiliations
                [1 ]Solid State Physics Department, Applied Physics Division, Soreq NRC, Yavne 81800, Israel
                [2 ]SCD-SemiConductor Devices, P.O. Box 2250, Haifa 31021, Israel
                Article
                10.1063/1.5005097
                80b50231-0e02-46d3-9d75-b226967d9721
                © 2017
                History

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