- Record: found
- Abstract: not found
- Article: not found
Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures
Read this article at
ScienceOpenPublisher
There is no author summary for this article yet. Authors can add summaries to their articles on ScienceOpen to make them more accessible to a non-specialist audience.
Related collections
Most cited references6
- Record: found
- Abstract: not found
- Article: not found
Defects in epitaxial multilayers
J.W. Matthews, A.E. Blakeslee (1974)
- Record: found
- Abstract: not found
- Article: not found
GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy
J. C. Bean, L Feldman, A. Fiory … (1984)
- Record: found
- Abstract: not found
- Article: not found
Defects associated with the accommodation of misfit between crystals
J. Matthews (1975)