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    Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures

    Authors: ,

    Publication date (Print):

    Journal: Applied Physics Letters

    Publisher: AIP Publishing

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        Defects in epitaxial multilayers

         J.W. Matthews,  A.E. Blakeslee (1974)
        Article 0 comments Cited 650 times – based on 0 reviews     Review now
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          GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy

           J. C. Bean,  L Feldman,  A. Fiory … (1984)
          Article 0 comments Cited 203 times – based on 0 reviews     Review now
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            Defects associated with the accommodation of misfit between crystals

             J. Matthews (1975)
            Article 0 comments Cited 179 times – based on 0 reviews     Review now
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              Author and article information

              Journal
              Title: Applied Physics Letters
              Abbreviated Title: Appl. Phys. Lett.
              Publisher: AIP Publishing
              ISSN Print 0003-6951
              ISSN Electronic 1077-3118
              Publication date Created August 1985
              Publication date (Print): August 1985
              Volume: 47
              Issue: 3
              Pages: 322-324
              ID: 10.1063/1.96206
              Copyright statement: © 1985
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