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Calculation of critical layer thickness versus lattice mismatch for GexSi1−x/Si strained‐layer heterostructures
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Most cited references6
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Defects in epitaxial multilayers
J.W. Matthews, A.E. Blakeslee (1974)
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GexSi1−x/Si strained‐layer superlattice grown by molecular beam epitaxy
J. C. Bean, L Feldman, A. Fiory … (1984)
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Defects associated with the accommodation of misfit between crystals
J. Matthews (1975)