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      Simulation of Thin-TFETs Using Transition Metal Dichalcogenides: Effect of Material Parameters, Gate Dielectric on Electrostatic Device Performance

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          Abstract

          In recent years, a lot of scientific research effort has been put forth for the investigation of Transition Metal Dichalcogenides (TMDC) and other Two Dimensional (2D) materials like Graphene, Boron Nitride. Theoretical investigation on the physical aspects of these materials has revealed a whole new range of exciting applications due to wide tunability in electronic and optoelectronic properties. Besides theoretical exploration, these materials have been successfully implemented in electronic and optoelectronic devices with promising results. In this work, we have investigated the effect of monolayer TMDC materials and monolayer TMDC alloys on the performance of a promising electronic device that can achieve steep switching characteristics- thin Tunneling Filed Effect Transistor or thin-TFET, using self-consistent determination of conduction, valance band levels in the device and a simplified model of interlayer tunneling current that treats scattering semi-classically and incorporates the energy broadening effect using a Gaussian approximation. We have also explored the effect of gate dielectric material variation, interlayer material variation on the performance of the device.

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          Progress, challenges, and opportunities in two-dimensional materials beyond graphene.

          Graphene's success has shown that it is possible to create stable, single and few-atom-thick layers of van der Waals materials, and also that these materials can exhibit fascinating and technologically useful properties. Here we review the state-of-the-art of 2D materials beyond graphene. Initially, we will outline the different chemical classes of 2D materials and discuss the various strategies to prepare single-layer, few-layer, and multilayer assembly materials in solution, on substrates, and on the wafer scale. Additionally, we present an experimental guide for identifying and characterizing single-layer-thick materials, as well as outlining emerging techniques that yield both local and global information. We describe the differences that occur in the electronic structure between the bulk and the single layer and discuss various methods of tuning their electronic properties by manipulating the surface. Finally, we highlight the properties and advantages of single-, few-, and many-layer 2D materials in field-effect transistors, spin- and valley-tronics, thermoelectrics, and topological insulators, among many other applications.
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            Tunnel field-effect transistors as energy-efficient electronic switches.

            Power dissipation is a fundamental problem for nanoelectronic circuits. Scaling the supply voltage reduces the energy needed for switching, but the field-effect transistors (FETs) in today's integrated circuits require at least 60 mV of gate voltage to increase the current by one order of magnitude at room temperature. Tunnel FETs avoid this limit by using quantum-mechanical band-to-band tunnelling, rather than thermal injection, to inject charge carriers into the device channel. Tunnel FETs based on ultrathin semiconducting films or nanowires could achieve a 100-fold power reduction over complementary metal-oxide-semiconductor (CMOS) transistors, so integrating tunnel FETs with CMOS technology could improve low-power integrated circuits. © 2011 Macmillan Publishers Limited. All rights reserved
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              Thickness and strain effects on electronic structures of transition metal dichalcogenides: 2H-MX2semiconductors (M=Mo, W;X=S, Se, Te)

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                Author and article information

                Journal
                25 February 2018
                Article
                10.1007/s10825-017-0978-7
                1802.09140
                841f6b5d-a4d9-4746-aae6-e0924e16a57b

                http://creativecommons.org/licenses/by-nc-sa/4.0/

                History
                Custom metadata
                Journal of Computational Electronics 16.2 (2017): 228-239
                physics.comp-ph physics.app-ph

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