Geometrical and Statistical Properties of Systems of Linear Inequalities with Applications in Pattern Recognition

Cover, Thomas M.

doi:10.1109/PGEC.1965.264137

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Geometrical and Statistical Properties of Systems of Linear Inequalities with Applications in Pattern Recognition

Author(s): Thomas M. Cover

Publication date (Print): June 1965

Journal: IEEE Transactions on Electronic Computers

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

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Title: IEEE Transactions on Electronic Computers

Abbreviated Title: IEEE Trans. Electron. Comput.

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

ISSN (Print): 0367-7508

Publication date Created: June 1965

Publication date (Print): June 1965

Volume: EC-14

Issue: 3

Pages: 326-334

Article

DOI: 10.1109/PGEC.1965.264137

SO-VID: 85509e7d-2e14-4b2e-b3c0-10914d334573

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Geometrical and Statistical Properties of Systems of Linear Inequalities with Applications in Pattern Recognition

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SDG 10: Reduced Inequalities

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