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      Making Classification Competitive for Deep Metric Learning

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          Abstract

          Deep metric learning aims to learn a function mapping image pixels to embedding feature vectors that model the similarity between images. The majority of current approaches are non-parametric, learning the metric space directly through the supervision of similar (pairs) or relatively similar (triplets) sets of images. A difficult challenge for training these approaches is mining informative samples of images as the metric space is learned with only the local context present within a single mini-batch. Alternative approaches use parametric metric learning to eliminate the need for sampling through supervision of images to proxies. Although this simplifies optimization, such proxy-based approaches have lagged behind in performance. In this work, we demonstrate that a standard classification network can be transformed into a variant of proxy-based metric learning that is competitive against non-parametric approaches across a wide variety of image retrieval tasks. We address key challenges in proxy-based metric learning such as performance under extreme classification and describe techniques to stabilize and learn higher dimensional embeddings. We evaluate our approach on the CAR-196, CUB-200-2011, Stanford Online Product, and In-Shop datasets for image retrieval and clustering. Finally, we show that our softmax classification approach can learn high-dimensional binary embeddings that achieve new state-of-the-art performance on all datasets evaluated with a memory footprint that is the same or smaller than competing approaches.

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          Deep Metric Learning via Lifted Structured Feature Embedding

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            DeepFashion: Powering Robust Clothes Recognition and Retrieval with Rich Annotations

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              Deep Metric Learning with Angular Loss

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                Author and article information

                Journal
                30 November 2018
                Article
                1811.12649
                86718576-1065-4acc-8f02-25563de6834b

                http://arxiv.org/licenses/nonexclusive-distrib/1.0/

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                Custom metadata
                cs.CV

                Computer vision & Pattern recognition
                Computer vision & Pattern recognition

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