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      An empirical stopping power relationship for low-energy electrons

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      Scanning
      Wiley-Blackwell

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          Secondary electron emission in the scanning electron microscope

          H E SEILER (1983)
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            Electron inelastic mean free paths and energy losses in solids II

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              Electron inelastic mean free paths and energy losses in solids

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                Author and article information

                Journal
                Scanning
                Scanning
                Wiley-Blackwell
                01610457
                1989
                August 1989
                : 11
                : 4
                : 176-180
                Article
                10.1002/sca.4950110404
                8766fd68-9f9d-45f8-bd0a-510494a7aacf
                © 1989

                http://doi.wiley.com/10.1002/tdm_license_1.1

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