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      Separation of film thickness and grain boundary strengthening effects in Al thin films on Si

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      Journal of Materials Research
      Cambridge University Press (CUP)

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          Mechanical properties of thin films

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            Measurement and Interpretation of stress in aluminum-based metallization as a function of thermal history

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              Elastic relationships in layered composite media with approximation for the case of thin films on a thick substrate

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                Author and article information

                Journal
                applab
                Journal of Materials Research
                J. Mater. Res.
                Cambridge University Press (CUP)
                0884-2914
                2044-5326
                August 1992
                January 2011
                : 7
                : 08
                : 2040-2048
                Article
                10.1557/JMR.1992.2040
                881624c6-4954-48a7-9c0c-ac10dcb45687
                © 1992
                History

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