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      A hard X-ray nanoprobe beamline for nanoscale microscopy

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          Abstract

          The Hard X-ray Nanoprobe Beamline is a precision platform for scanning probe and full-field microscopy with 3–30 keV X-rays. A combination of high-stability X-ray optics and precision motion sensing and control enables detailed studies of the internal features of samples with resolutions approaching 30 nm.

          Abstract

          The Hard X-ray Nanoprobe Beamline (or Nanoprobe Beamline) is an X-ray microscopy facility incorporating diffraction, fluorescence and full-field imaging capabilities designed and operated by the Center for Nanoscale Materials and the Advanced Photon Source at Sector 26 of the Advanced Photon Source at Argonne National Laboratory. This facility was constructed to probe the nanoscale structure of biological, environmental and material sciences samples. The beamline provides intense focused X-rays to the Hard X-ray Nanoprobe (or Nanoprobe) which incorporates Fresnel zone plate optics and a precision laser sensing and control system. The beamline operates over X-ray energies from 3 to 30 keV, enabling studies of most elements in the periodic table, with a particular emphasis on imaging transition metals.

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          Author and article information

          Conference
          J Synchrotron Radiat
          J Synchrotron Radiat
          J. Synchrotron Rad.
          Journal of Synchrotron Radiation
          International Union of Crystallography
          0909-0495
          1600-5775
          01 November 2012
          05 September 2012
          05 September 2012
          : 19
          : Pt 6 ( publisher-idID: s120600 )
          : 1056-1060
          Affiliations
          [a ]Center for Nanoscale Materials, Argonne National Laboratory , 9700 South Cass Avenue, Argonne, IL 60441, USA
          [b ]Advanced Photon Source and Center for Nanoscale Materials, Argonne National Laboratory , 9700 South Cass Avenue, Argonne, IL 60441, USA
          [c ]Advanced Photon Source, Argonne National Laboratory , 9700 South Cass Avenue, Argonne, IL 60441, USA
          Author notes
          Correspondence e-mail: winarski@ 123456anl.gov
          Article
          ie5086 JSYRES S0909049512036783
          10.1107/S0909049512036783
          3579591
          23093770
          8963fe7f-328e-400c-9f97-63912e0ab792
          © Robert P. Winarski et al. 2012

          This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.

          International Workshop on Improving Data Quality and Quantity for XAFS Experiments (Q2XAFS2011)
          History
          : 27 June 2012
          : 24 August 2012
          Categories
          Beamlines

          Radiology & Imaging
          zone plate,nanotomography,x-ray fluorescence,x-ray nanoprobe,x-ray microscopy,nanodiffraction

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