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      Scanning electron microscope identification of weak links in superconducting thin films

      , , , ,
      Applied Physics Letters
      AIP Publishing

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          Superconducting Y‐Ba‐Cu‐O oxide films by sputtering

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            Application of low-temperature scanning electron microscopy to superconductors

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              Spatially resolved observation of the critical current in high-T c superconducting films

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                Author and article information

                Journal
                Applied Physics Letters
                Appl. Phys. Lett.
                AIP Publishing
                0003-6951
                1077-3118
                September 26 1988
                September 26 1988
                : 53
                : 13
                : 1210-1212
                Article
                10.1063/1.100667
                8afa8a26-2578-4a0b-b6e1-d31eef1e64e3
                © 1988
                History

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