Interior X-ray diffraction tomography with low-resolution exterior information

Abstract

X-ray diffraction tomography (XDT) resolves spatially-variant XRD profiles within macroscopic objects, and provides improved material contrast compared to the conventional transmission-based computed tomography (CT). However, due to the small diffraction cross-section, XDT suffers from long imaging acquisition time, which could take tens of hours for a full scan using a table-top X-ray tube. In some medical and industrial imaging applications, only the XRD measurement within a region-of-interest (ROI) is required, which, together with the demand to reduce imaging time and radiation dose to the sample, motivates the development of interior XDT systems that scan and reconstruct only an internal region within the sample. Though interior XDT reconstruction using prior knowledge within the ROI can reduce truncation artifacts, it often also causes erroneous reconstruction of fine features. Here we propose a quasi-interior XDT scheme that utilizes a small fraction of projection information from the exterior region to assist interior reconstruction. The low-resolution exterior projection data removes the requirement of prior knowledge about the sample, and allows the ROI reconstruction to be performed with the fast, widely-used CT back-projection algorithm for easy integration onto real-time XDT scanning modules.