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      The AFM as a tool for surface imaging

      Surface Science
      Elsevier BV

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          Author and article information

          Journal
          Surface Science
          Surface Science
          Elsevier BV
          00396028
          January 1994
          January 1994
          : 299-300
          :
          : 980-995
          Article
          10.1016/0039-6028(94)90711-0
          90483281-e035-4a3a-981a-d484678ad295
          © 1994

          http://www.elsevier.com/tdm/userlicense/1.0/

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          Comments

          added an editorial note to Atomic Force Microscopy

          An early reviews on AFM imaging by one of AFM co-inventors.

          2016-02-29 06:53 UTC
          +1

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