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      Numerical optimization of spherical variable-line-spacing grating X-ray spectrometers

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          Abstract

          Operation of an X-ray spectrometer based on a spherical variable-line-spacing grating is analyzed using dedicated ray-tracing software allowing fast optimization of the grating parameters and spectrometer geometry.

          Abstract

          Operation of an X-ray spectrometer based on a spherical variable-line-spacing (VLS) grating is analyzed using dedicated ray-tracing software allowing fast optimization of the grating parameters and spectrometer geometry. The analysis is illustrated with optical design of a model spectrometer to deliver a resolving power above 20400 at a photon energy of 930 eV (Cu L-edge). With this energy taken as reference, the VLS coefficients are optimized to cancel the lineshape asymmetry (mostly from the coma aberrations) as well as minimize the symmetric aberration broadening at large grating illuminations, dramatically increasing the aberration-limited vertical acceptance of the spectrometer. For any energy away from the reference, corrections to the entrance arm and light incidence angle on the grating are evaluated to maintain the exactly symmetric lineshape. Furthermore, operational modes when these corrections are coordinated are evaluated to maintain either energy-independent focal curve inclination or maximal aberration-limited spectrometer acceptance. The results are supported by analytical evaluation of the coma term of the optical path function. This analysis thus gives a recipe for designing a high-resolution spherical VLS grating spectrometer operating with negligible aberrations at large acceptance and over an extended energy range.

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          Author and article information

          Journal
          J Synchrotron Radiat
          J. Synchrotron Rad.
          Journal of Synchrotron Radiation
          International Union of Crystallography
          0909-0495
          1600-5775
          01 March 2011
          29 January 2011
          29 January 2011
          : 18
          : Pt 2 ( publisher-idID: s110200 )
          : 134-142
          Affiliations
          [a ]Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen-PSI, Switzerland
          [b ]UPMC University Paris 06, CNRS UMR 7614, Laboratoire de Chimie Physique – Matière et Rayonnement, 75321 Paris Cedex 05, France
          Author notes
          Correspondence e-mail: vladimir.strocov@ 123456psi.ch
          Article
          ve5006 JSYRES S0909049510054452
          10.1107/S0909049510054452
          3133478
          21335898
          907d6806-0684-4774-9c7a-c49120dd15d1
          © V. N. Strocov et al. 2011

          This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.

          History
          : 29 November 2010
          : 27 December 2010
          Categories
          Research Papers

          Radiology & Imaging
          x-ray optics,x-ray spectrometers,spherical vls gratings,resonant inelastic x-ray scattering

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